ToF + SIMS: Materials Analysis by Mass Spectrometry, 2nd Edition,TOF-SIMS: 質量分析法による材料分析, 第2版,9781906715175,978-1-906715-17-5

ToF + SIMS: Materials Analysis by Mass Spectrometry, 2nd Edition

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ToF + SIMS: Materials Analysis by Mass Spectrometry, 2nd Edition

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書名

ToF + SIMS: Materials Analysis by Mass Spectrometry, 2nd Edition
TOF-SIMS: 質量分析法による材料分析, 第2版
著者・編者 John C.Vickerman and David Briggs
出版社 IM Publications
発行年 2013年  
装丁 Hardcover
ページ数 732 ページ
ISBN 978-1-906715-17-5
発送予定 1-2営業日以内に発送致します
 

Description

ToF-SIMSは表面分析法の中で最も多用途であり、この30年の間に様々な発展を遂げています。
本書は第1版よりも更に簡潔にわかりやすくまとめられており計測機器や試料の取り扱い、分子動力学シミュレーションやデータ解析、応用分析などの章にわかれています。



Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. Current instrumentation provides a powerful combination of capabilities for molecular detection and trace element determination, imaging in two and three dimensions, and microanalysis.

This is the Second Edition of the first book to be dedicated to the subject and the treatment is comprehensive. Following overview and historical chapters, there are sections devoted to instrumentation and sample handling, fundamentals and molecular dynamics simulations, optimisation methods--including laser post-ionisation of sputtered neutrals, data interpretation and analytical applications.

All the contributors are internationally recognised as leaders in their respective fields and come from both Europe, USA and Asia.

 

Contents:

・Prologue: ToF-SIMS-An evolving mass spectrometry of materials (John C. Vickerman
・The history of Static SIMS-A personal perspective (Alfred Benninghoven)
・Status of cascad theory (Herbert M. Urbassek)
・Fundamentals of organic SIMS: insights from experiments and models (Arnaud Delcorte)
・Molecular speciation analysis of inorganic compounds (Luc van Vaeck)
・Molecular dynamics simulations, the theorectical partner to dynamic cluster SIMS experiments (Barbara J.Garrison and Zbigniew Postawa))
・Cationisation (Birgit Hagenhoff)
・Laser post-ionisation-fundamentals (Andreas Wucher)
・Time-of-flight mass analysers (Bruno W. Schueler)
・Analysis beams used in toF-SIMS (Rowland Hill)
・Cluster and polyatomic primary ion beams (John S. fletcher and Christopher Szakal)
・Molecular depth profiling (Alex Shard, Ian Gilmore and Andreas Wucher)
・Role of operating conditions in ToF-SIMS (Ian Gilmore)
・Laser post-ionisation for elemental and molecular surface analysis (Nicholoas P. Lockyer)
・Sample handling for ToF-SIMS (Fraser Reich)
・Qualitative interpretation of spectra (David Briggs and Ian W. Fletcher)
・Multivariate analysis of SIMS spectra (Alex Henderson)
・ToF-SIMS image analysis (Bonnie J. Tyler)
・Characterisation of polymeric materials (Lutao Weng and Chiming Chan)
・li>Functional modification of surfaces using self-assembled monolayers (Amy Walker)
・Application of SIMS to study of biological systems (Alain M. Piwowar and Nicholas Winograd)
・Medical and biological applications of cluster ToF-SIMS (David Touboul, Oliver Laprevote and Alain Brunelle)
・Depth profiling of inorganic materials (Ewald Niehuis and Thomas Grehl)
・Depth profiling in organic electronics (Ewald Niehuis)
・Contamination monitoring and failure analysis (Arwa Ginwalla, Thomas, F. Fister and Ian A. Mowat)
・Photographic and digital graphic materials (Luc van Vaeck, Yannick Vercammen, Jens Lenaerts, Roel de Mondt, Jaymes van Luppen and Frank Vangaever)
・Applications of ToF-SIMS in cosmochemistry (Thomas Stephan and Ian C. Lyon)
・Index